商品名：氧化铟
别 名：纳米三氧化二铟
indium sesquioxide
英文名：Indium oxide
产 地：湖南
Cas号：1312-43-2
MDL：MFCD00011060
Beilstein：
EINECS：215-193-9
分子结构：
分子式：In2O3
分子量：277.6400
备注：
性状：
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浅黄色粉末，受热后逐渐变成红褐色。不溶于水，易溶于酸。
密度：7.18
沸点：850℃
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纳米氧化铟采用气化法制造，具有高纯度，优良分散性、流动性和可成型性等特点。
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质量标准：99.99% metals basis:
外观Appearance Yellow Powder
X-射线衍射分析X-Ray Diffraction Conforms to Structure
纯度Purity ≥99.99% Based on Trace Metals Impurities of ICP
ICP: Confirms Indium Component Confirmed
In ≥80.2 % (Complexiometric EDTA)
痕量金属分析total metallic impurities ≤200ppm by ICP Atomic emission
(Al、Ca、Fe、Mg、Sb、Sn、Ti、Zn)
99.99% metals basis，
<100 nm (TEM)>
外观Appearance Yellow Powder
X-射线衍射分析X-Ray Diffraction Conforms to Structure
纯度Purity ≥99.99% Based on Trace Metals Impurities of ICP
ICP: Confirms Indium Component Confirmed
In ≥80.2 % (Complexiometric EDTA)
痕量金属分析total metallic impurities ≤200ppm by ICP Atomic emission
(Al、Ca、Fe、Mg、Sb、Sn、Ti、Zn)
平均粒径Particle size ≤100 nm(TEM)
99.99% metals basis，
<50 nm (TEM)>
外观Appearance Yellow Powder
X-射线衍射分析X-Ray Diffraction Conforms to Structure
纯度Purity ≥99.99% Based on Trace Metals Impurities of ICP
ICP: Confirms Indium Component Confirmed
In ≥80.2 % (Complexiometric EDTA)
痕量金属分析total metallic impurities ≤200ppm by ICP Atomic emission
(Al、Ca、Fe、Mg、Sb、Sn、Ti、Zn)
平均粒径Particle size ≤50 nm(TEM)
99.999% metals basis:
外观Appearance Yellow Powder
X-射线衍射分析X-Ray Diffraction Conforms to Structure
纯度Purity ≥99.99% Based on Trace Metals Impurities of ICP
ICP: Confirms Indium Component Confirmed
In 81.0 - 84.3 % (Complexiometric EDTA)
痕量金属分析total metallic impurities ≤20ppm by ICP Atomic emission
(Sb、As、Ca、Cu、Pb、Na、Sn、Zn)
存储：
用途：主要用于作电池原材料 ，荧光屏，玻璃，陶瓷，化学试剂等。
联合编号：
RISK：
Safety：
Hazard：